loop: Split setting of lo_state from loop_clr_fd (a2505b79) · Commits · 戴 / test

drivers/block/loop.c

+31 −21

Original line number	Diff line number	Diff line
		@@ -975,7 +975,7 @@ static int loop_set_fd(struct loop_device *lo, fmode_t mode,
		loop_reread_partitions(lo, bdev);

		/* Grab the block_device to prevent its destruction after we
		* put /dev/loopXX inode. Later in loop_clr_fd() we bdput(bdev).
		* put /dev/loopXX inode. Later in __loop_clr_fd() we bdput(bdev).
		*/
		bdgrab(bdev);
		return 0;
		@@ -1025,31 +1025,15 @@ loop_init_xfer(struct loop_device lo, struct loop_func_table xfer,
		return err;
		}

		static int loop_clr_fd(struct loop_device *lo)
		static int __loop_clr_fd(struct loop_device *lo)
		{
		struct file *filp = lo->lo_backing_file;
		gfp_t gfp = lo->old_gfp_mask;
		struct block_device *bdev = lo->lo_device;

		if (lo->lo_state != Lo_bound)
		if (WARN_ON_ONCE(lo->lo_state != Lo_rundown))
		return -ENXIO;

		/*
		* If we've explicitly asked to tear down the loop device,
		* and it has an elevated reference count, set it for auto-teardown when
		* the last reference goes away. This stops $!~#$@ udev from
		* preventing teardown because it decided that it needs to run blkid on
		* the loopback device whenever they appear. xfstests is notorious for
		* failing tests because blkid via udev races with a losetup
		* <dev>/do something like mkfs/losetup -d <dev> causing the losetup -d
		* command to fail with EBUSY.
		*/
		if (atomic_read(&lo->lo_refcnt) > 1) {
		lo->lo_flags \|= LO_FLAGS_AUTOCLEAR;
		mutex_unlock(&loop_ctl_mutex);
		return 0;
		}

		if (filp == NULL)
		return -EINVAL;

		@@ -1057,7 +1041,6 @@ static int loop_clr_fd(struct loop_device *lo)
		blk_mq_freeze_queue(lo->lo_queue);

		spin_lock_irq(&lo->lo_lock);
		lo->lo_state = Lo_rundown;
		lo->lo_backing_file = NULL;
		spin_unlock_irq(&lo->lo_lock);

		@@ -1110,6 +1093,30 @@ static int loop_clr_fd(struct loop_device *lo)
		return 0;
		}

		static int loop_clr_fd(struct loop_device *lo)
		{
		if (lo->lo_state != Lo_bound)
		return -ENXIO;
		/*
		* If we've explicitly asked to tear down the loop device,
		* and it has an elevated reference count, set it for auto-teardown when
		* the last reference goes away. This stops $!~#$@ udev from
		* preventing teardown because it decided that it needs to run blkid on
		* the loopback device whenever they appear. xfstests is notorious for
		* failing tests because blkid via udev races with a losetup
		* <dev>/do something like mkfs/losetup -d <dev> causing the losetup -d
		* command to fail with EBUSY.
		*/
		if (atomic_read(&lo->lo_refcnt) > 1) {
		lo->lo_flags \|= LO_FLAGS_AUTOCLEAR;
		mutex_unlock(&loop_ctl_mutex);
		return 0;
		}
		lo->lo_state = Lo_rundown;

		return __loop_clr_fd(lo);
		}

		static int
		loop_set_status(struct loop_device lo, const struct loop_info64 info)
		{
		@@ -1691,11 +1698,14 @@ static void lo_release(struct gendisk *disk, fmode_t mode)
		goto out_unlock;

		if (lo->lo_flags & LO_FLAGS_AUTOCLEAR) {
		if (lo->lo_state != Lo_bound)
		goto out_unlock;
		lo->lo_state = Lo_rundown;
		/*
		* In autoclear mode, stop the loop thread
		* and remove configuration after last close.
		*/
		err = loop_clr_fd(lo);
		err = __loop_clr_fd(lo);
		if (!err)
		return;
		} else if (lo->lo_state == Lo_bound) {

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