Commit a0c29afb authored by Chen-Yu Tsai's avatar Chen-Yu Tsai Committed by Mauro Carvalho Chehab
Browse files

media: ov5640: Add register definition for test pattern register 



The OV5640 can generate many types of test patterns, some with
additional modifiers, such as a rolling bar, or gamma gradients.

Add the bit definitions for all bits in the test pattern register,
and use them to compose the values to be written to the register.

Signed-off-by: default avatarChen-Yu Tsai <wens@csie.org>
Signed-off-by: default avatarSakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: default avatarMauro Carvalho Chehab <mchehab+samsung@kernel.org>
parent 9f6d7bac

drivers/media/i2c/ov5640.c

+22 −2
Original line number Diff line number Diff line
@@ -2446,10 +2446,30 @@ static const char * const test_pattern_menu[] = { 
	"Color bars",

};



#define OV5640_TEST_ENABLE		BIT(7)

#define OV5640_TEST_ROLLING		BIT(6)	/* rolling horizontal bar */

#define OV5640_TEST_TRANSPARENT		BIT(5)

#define OV5640_TEST_SQUARE_BW		BIT(4)	/* black & white squares */

#define OV5640_TEST_BAR_STANDARD	(0 << 2)

#define OV5640_TEST_BAR_VERT_CHANGE_1	(1 << 2)

#define OV5640_TEST_BAR_HOR_CHANGE	(2 << 2)

#define OV5640_TEST_BAR_VERT_CHANGE_2	(3 << 2)

#define OV5640_TEST_BAR			(0 << 0)

#define OV5640_TEST_RANDOM		(1 << 0)

#define OV5640_TEST_SQUARE		(2 << 0)

#define OV5640_TEST_BLACK		(3 << 0)



static const u8 test_pattern_val[] = {

	0,

	OV5640_TEST_ENABLE | OV5640_TEST_TRANSPARENT |

		OV5640_TEST_BAR_VERT_CHANGE_1 |

		OV5640_TEST_BAR,

};



static int ov5640_set_ctrl_test_pattern(struct ov5640_dev *sensor, int value)

{

	return ov5640_mod_reg(sensor, OV5640_REG_PRE_ISP_TEST_SET1,

			      0xa4, value ? 0xa4 : 0);

	return ov5640_write_reg(sensor, OV5640_REG_PRE_ISP_TEST_SET1,

				test_pattern_val[value]);

}



static int ov5640_set_ctrl_light_freq(struct ov5640_dev *sensor, int value)

CRA Git | Maintained and supported by SUSTech CRA and CCSE