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The first (sixt) byte in the OOB area contains vendor's bad block information. During identification of the NAND chip this information is collected by scanning the complete chip. The option NAND_USE_FLASH_BBT is used to store this information in a sector so we don't have to scan the complete flash. Unfortunately the code stores a marker in order to recognize the BBT in the OOB area. This will fail if the OOB area is completely used for ECC. This patch introduces the option NAND_USE_FLASH_BBT_NO_OOB which has to be used with NAND_USE_FLASH_BBT. It will then store BBT on flash without touching the OOB area. The BBT format on flash remains same except the first page starts with the recognition pattern followed by the version byte. This change was tested in nandsim and it looks good so far :) Signed-off-by:Sebastian Andrzej Siewior <bigeasy@linutronix.de> Signed-off-by:
David Woodhouse <David.Woodhouse@intel.com>
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