1
课程详述
COURSE SPECIFICATION
以下课程信息可能根据实际授课需要或在课程检讨之后产生变动。如对课程有任何疑问，请联
系授课教师。
The course information as follows may be subject to change, either during the session because of unforeseen
circumstances, or following review of the course at the end of the session. Queries about the course should be
directed to the course instructor.
1.
课程名称 Course Title
现代材料分析技术 Modern Techniques in Materials Characterization
2.
授课院系
Originating Department
物理系 Department of Physics
3.
课程编号
Course Code
PHY425
4.
课程学分 Credit Value
3
5.
课程类别
Course Type
专业选修课 Major Elective Courses
6.
授课学期
Semester
秋季 Fall
7.
授课语言
Teaching Language
英文 English
8.
授课教师、所属学系、联系方
式（如属团队授课，请列明其
他授课教师）
Instructor(s), Affiliation&
Contact
（For team teaching, please list
all instructors）
王克东副教授，物理系
慧园一栋 404 室
Kedong Wang, Associate Professor, Department of Physics
Rm. 404, Building 1，HuiYuan
wangkd@sustech.edu.cn
0755-8801-8207
9.
实验员/助教、所属学系、联系
方式
Tutor/TA(s), Contact
待公布 To be announced
10.
选课人数限额(可不填)
Maximum Enrolment
（Optional）
40
2
授课方式
Delivery Method
讲授
Lectures
习题/辅导/讨论
Tutorials
实验/实习
Lab/Practical
其它(请具体注明)
Other（Please specify）
总学时
Total
11.
学时数
Credit Hours
32
32
复习、考试（2 周）
Revision & Exam (2
weeks)
64
12.
先修课程、其它学习要求
Pre-requisites or Other
Academic Requirements
量子力学 I Introduction to Quantum Mechanics （PHY206-15）
13.
后续课程、其它学习规划
Courses for which this course
is a pre-requisite
无
NA
14.
其它要求修读本课程的学系
Cross-listing Dept.
无
NA
教学大纲及教学日历 SYLLABUS
15.
教学目标 Course Objectives
This course covers the underlying theories and operation principles of some modern materials characterization
techniques, including ion beam techniques, surface analytical techniques, mass spectroscopic techniques, etc., which
are of prime importance in unveiling and understanding different properties of materials (e.g. chemical composition,
electrical properties, and electronic structures).
16.
预达学习成果 Learning Outcomes
After the course, the students are expected to be able to
Master the basic knowledge (both principle and operation) of commonly used materials characterization and
analytical techniques
Interpret experimental results obtained by the materials characterization techniques covered in the course
Apply the concepts and methodology in materials characterization in realistic problems and cases
Analyze, judge and solve realistic problems and cases in relation to materials characterization
Develop an analytical mind towards materials characterization and
Develop and establish methodology and experimental techniques for analyses of different properties of
materials
17.
课程内容及教学日历 （如授课语言以英文为主，则课程内容介绍可以用英文；如团队教学或模块教学，教学日历须注明
主讲人）
Course Contents (in Parts/Chapters/Sections/Weeks. Please notify name of instructor for course section(s), if
this is a team teaching or module course.)
3
Lecture 1: Sample preparation and related techniques (1 week)
Week1: Lecture 1: Sample preparation and related techniques
1, Sample preparation: An analytical perspective
2, Sample preparation for specific material characterization
3, Vacuum
Lectures 2-5: Spectroscopic techniques (6 weeks)
Week2: Lecture 2 X-ray photoelectron spectroscopy
1. Background
2. Instrumentation
Week3: Lecture 2 X-ray photoelectron spectroscopy
3. Spectral Interpretations: The XPS spectrum and the calibrations, and the primary
structures
Week4: Lecture 2 X-ray photoelectron spectroscopy
3. Spectral Interpretations: secondary structures
4. Quantification
5. Chemical mapping
Week5: Lecture 3:Auger electron spectroscopy
1.Background
2. Instrumentation
3. Spectral Interpretations
Week6: Lecture4:Photoemission Spectroscopy
1. Nomenclature
2. Principles
3. Instrumentation: UV source
4. UV Photoemission analysis, Angle-resolved UPS, Angle-integrated UPS
5*.Synchrotron radiation
Week7: Lecture5:Proton (or particle)-Induced X-ray Emission (PIXE)
1. Background
2. Instrumentation
3. Data interpretation
4. PIXE analysis and applications
Lectures 6-7: Mass spectroscopic techniques (3 weeks)
Week8: Lecture 6: Mass Spectrometry (MS)
1. Background
2. Principles: sample introduction and ionization methods
Week9: Lecture 6: Mass Spectrometry (MS)
3. Ion separation and detection
4.Data interpretation
5. Applications
Week10: Lecture 7 Secondary ion mass spectrometry (SIMS)
1. Types of SIMS
2. Basic principles
3. Instrumentation
4. SIMS analysis
Lecture 8-9: Diffraction techniques (6 weeks)
Week11: Lecture 8: Transmission electron microscopy
Part I An introduction to TEM
1. What is TEM
2. The instrument and some basic concepts
3. TEM operation modes
Week12: Lecture 8: Transmission electron microscopy
Part II, Crystal structures and TED
General experimental
procedures and guidelines
for sample preparation
Spectroscopic techniques
for study on surface
composition, chemical
environment, and surface
electronic properties
Mass spectroscopic
analytical techniques for
study on chemical
composition (MS) and
atomic composition (SIMS)
Diffraction techniques for
study on crystal structure
(TEM) and surface
structure (LEED)
4
1. Transmission Electron Diffraction (TED)
2. Diffraction pattern and indexing of diffraction patterns
Week13: Lecture 8: Transmission electron microscopy
Part III, TEM Image Contrast
Week14: Lecture 8: Transmission electron microscopy
Part IV, High Resolution Imaging
Week15: Lecture 9:low energy electron diffraction(LEED)
1. Background
2. Instrumentation
3. Principles
4. Qualitative LEED
Week16: Lecture 9:low energy electron diffraction(LEED)
5. Quantitative LEED
6. Example of analysis
7. A brief introduction of RHEED
18.
教材及其它参考资料 Textbook and Supplementary Readings
No textbook.
Supplementary readings:
• P. E. F. Flewitt and R. K. Wild, “Physical Methods for Materials Characterization”, Institute of Physics (IOP)
Publishing Ltd., 2nd ed. 2003
• C. R. Brundle, C. A. Evans Jr., and S. Wilson, “Encyclopaedia of Materials Characterization”, Butterworth-
Heinemann & Manning Publications Co., 1992,
• J. C. Riviere, “Surface Analytical Techniques”, Clarendon Press, Oxford, 1990
• D. A. Skoog,, F. J. Holler, and T. A. Nieman, “Principles of Instrumental Analysis”, 5th ed.,Saunders College
Publishing, 5th ed. 1998
• B. D. Cullity, “Element of X-ray Diffraction”, 2nd ed., Addison-Wiley Publisher, 1978
• P. B. Hirsch, H. Howie, R. B. Nicholson, D. W. Pashley, and M. J. Whelan, “Electron Microscopy of Thin
Crystals”, Butterworths, 1965
• H. E. Duckworth, R.C. Barbar, and V.S.Venkatasubramanian, “Mass Spectroscopy”, 2nd ed. Cambridge
University Press, 1986
• C. N. Banwell, E. M. McCash. “Fundamentals of Molecular Spectroscopy”, 4th ed. London, New York :
McGraw-Hill, 1994
• W. Czanderna, T. E. Madey, and C. J. Powell, “Beam effects, surface topography and depth profiling in surface
analysis, Kluwer Academic, New York, 2002
5
课程评估 ASSESSMENT
19.
评估形式
Type of
Assessment
评估时间
Time
占考试总成绩百分比
% of final
score
违纪处罚
Penalty
备注
Notes
出勤 Attendance
10%
课堂表现
Class
Performance
小测验
Quiz
课程项目 Projects
平时作业
Assignments
20%
Including Lab reports.
期中考试
Mid-Term Test
期末考试
Final Exam
50%
Fail
期末报告
Final
Presentation
20%
Fail
其它（可根据需要
改写以上评估方
式）
Others (The
above may be
modified as
necessary)
20.
记分方式 GRADING SYSTEM
A. 十三级等级制 Letter Grading
B. 二级记分制（通过/不通过） Pass/Fail Grading
课程审批 REVIEW AND APPROVAL
21.
本课程设置已经过以下责任人/委员会审议通过
This Course has been approved by the following person or committee of authority
物理系教学指导委员会
Education Instruction Committee of Physics department
