1
课程详述
COURSE SPECIFICATION
以下课程信息可能根据实际授课需要或在课程检讨之后产生变动。如对课程有任何疑问，请
联系授课教师。
The course information as follows may be subject to change, either during the session because of unforeseen
circumstances, or following review of the course at the end of the session. Queries about the course should be
directed to the course instructor.
1.
课程名称 Course Title
纳米探针在化学、物理及材料科学中的应用
Nanoprobes in Chemistry, Physics and Material Science
2.
授课院系
Originating Department
材料科学与工程系
Department of Materials Science and Engineering
3.
课程编号
Course Code
MSES105
4.
课程学分 Credit Value
2
5.
课程类别
Course Type
专业选修课 Major Elective Courses
6.
授课学期
Semester
夏季 Summer
7.
授课语言
Teaching Language
英文 English
8.
授课教师、所属学系、联系方
式（如属团队授课，请列明其
他授课教师）
Instructor(s), Affiliation&
Contact
（For team teaching, please list
all instructors）
9.
实验员/助教、所属学系、联系
方式
Tutor/TA(s), Contact
待公布 To be announced
10.
选课人数限额(可不填)
Maximum Enrolment
（Optional）
授课方式
Delivery Method
讲授
Lectures
习题/辅导/讨论
Tutorials
实验/实习
Lab/Practical
其它(请具体注明)
Other（Please specify）
总学时
Total
11.
学时数
Credit Hours
32
32
2
12.
先修课程、其它学习要求
Pre-requisites or Other
Academic Requirements
13.
后续课程、其它学习规划
Courses for which this course
is a pre-requisite
14.
其它要求修读本课程的学系
Cross-listing Dept.
教学大纲及教学日历 SYLLABUS
15.
教学目标 Course Objectives
This course contains the application of nanoprobes in material science, physics and chemistry. The course
will prepare the students to evaluate nanoprobes for specific analytical tasks. Beside lectures explaining the
fundamental aspects of the techniques, seminars will be used to discuss actual literature on the respective
techniques.
16.
预达学习成果 Learning Outcomes
After the course learning, the students will understand the application of nanoprobes in material science,
physics and chemistry and be able to use suitable ones in practical study.
17.
课程内容及教学日历 （如授课语言以英文为主，则课程内容介绍可以用英文；如团队教学或模块教学，教学日历须注明
主讲人）
Course Contents (in Parts/Chapters/Sections/Weeks. Please notify name of instructor for course section(s), if
this is a team teaching or module course.)
Courses 1 & 2 (6 Credit hours)
Introduction /Motivation: Length scales, physical properties, quantization effects, nano-objects
(nanoparticles, anisotropic nanocrystals, core-shell structures) – specific applications. Quantization in
different dimensions, preparation: ''bottom-up" / "top-down" approach; thin film systems, epitaxy, growth
modes; clusters (magic numbers, shell model), molecular Nanosystems.
Courses 3 & 4 (6 Credit hours)
Nanoprobes: General requirements, potential techniques; resolution limit, imaging techniques vs. studies in
reciprocal space. Visible Light Microscopy (VLM): experimental setup, concept of magnification, numerical
aperture, contrast mechanisms and contrast enhancement, image distortions, correction methods; optical
spectroscopy and its combination with microscopic imaging (e.g., Raman imaging). Specific optical imaging
techniques: confocal microscopy, two-photon excitations; single-molecule spectroscopy, STED; 4π-imaging;
digital imaging; inline holography.
Courses 5 & 6 (6 Credit hours)
3
Scanning probe techniques: Atomic-Force Microscopy (AFM) – basic considerations, forces at surfaces,
piezo-scanners, experimental setup, modes of operation, sample environment. Scanning Tunneling
Microscopy (STM), tunneling effect, theoretical considerations, tunneling spectroscopy (STS), I-V-
characteristics, tip-sample interactions; vibrational spectroscopy.Specific scanning probes: magnetic force
microscopy vs. spin-polarized STM; SNOM; Nanophoto lithography, Electrochemical Force Microscopy;
Scanning Thermal Microscopy, Scanning Capacitance Microscopy, Kelvin Probe Analysis – Literature
seminar on recent scanning probe analysis.
Courses 7 & 8 (8 Credit hours)
Electron probes: emitted electrons – field electron microscopy, field ion microscopy, photoelectron emission
microscopy (PEEM). Incoming electron techniques: Scanning electron microscopy (SEM); electron optics,
electron-sample interactions, electron cascades, secondary detectors. Low-energy electron microscopy
(LEEM), modes of operation, bright vs. dark field imaging, real-time imaging; phase transitions. Transmission
electron microscopy (TEM); experimental setup, comparison with VLM; modes of operation, diffraction
imaging, HR-TEM; STEM; aberration correction; TEM-EELS as spectroscopic tool.
Courses 9 & 10 (6 Credit hours)
X-ray based techniques: x-ray sources, holography radiation, x-ray microscopy with lenses, lenses imaging:
Imaging with coherent sources: holography, coherent diffraction imaging, ptychography, laminography;
magnetic imaging (XMCD), time-resolved x-ray microscopy. Imaging in reciprocal space: XRD, small-angle
x-ray scattering, basic considerations, shape analysis. Comparative discussion of all relevant nanoprobes;
which technique is most appropriate for specific applications?
18.
教材及其它参考资料 Textbook and Supplementary Readings
课程评估 ASSESSMENT
19.
评估形式
评估时间
占考试总成绩百分比
违纪处罚
备注
4
Type of
Assessment
Time
% of final
score
Penalty
Notes
出勤 Attendance
20
课堂表现
Class
Performance
10
小测验
Quiz
课程项目 Projects
平时作业
Assignments
期中考试
Mid-Term Test
期末考试
Final Exam
70
期末报告
Final
Presentation
其它（可根据需要
改写以上评估方
式）
Others (The
above may be
modified as
necessary)
20.
记分方式 GRADING SYSTEM
A. 十三级等级制 Letter Grading
B. 二级记分制（通过/不通过） Pass/Fail Grading
课程审批 REVIEW AND APPROVAL
21.
本课程设置已经过以下责任人/委员会审议通过
This Course has been approved by the following person or committee of authority
