课程大纲
COURSE SYLLABUS
1.
课程代码/名称
Course Code/Title
MSE5018/先进材料表征技术
2.
课程性质
Compulsory/Elective
专业课
3.
课程学分/学时
Course Credit/Hours
3 学分/48 学时
4.
授课语言
Teaching Language
英文
5.
授课教师
Instructor(s)
任富增/于严淏
6.
是否面向本科生开放
Open to undergraduates
or not
是
7.
先修要求
Pre-requisites
本科生需修过：
MSE001
《
Fundamentals of Materials Science and Engineering
》
、
MSE203
《
Crystallography
》两门课程。
研究生：无
8.
教学目标
Course Objectives
This course is to introduce the fundamental theoretical framework for diffraction, spectroscopy and imaging
methods used in the microstructure, composition and surface characterization of engineering materials. The aim is
to enable students to master the characterization methods for material science, to understand the theory, basic
structure and working principle of a variety of analytical instruments.
9.
教学方法
Teaching Methods
本课程以理论及实践结合为主要特点，针对 XRD, SEM, TEM, XPS, AES, SPM(AFM & STM), FIB, and Thermal
Analysis
等在材料科学研究中常用的分析表征技术进行讲解及讨论。
本课程不仅包括对这些技术的原理及操作流程的理论讲解，亦重视与具体实践应用相结合，以确保学生可以学习
完此课程后即可解决材料科学与工程相关研究中遇到的实际问题。
10.
教学内容
Course Contents
Section 1
Week 1-2 X-ray Diffraction (XRD): Basics, Quantitative Analysis and
Structure Refinement
Section 2
Week 3 Secondary Electron Microscopy (SEM)
Section 3
Week 4 Transmission Electron Microscopy (TEM): Basics
Section 4
Week 5 Transmission Electron Microscopy (TEM): Diffraction
Section 5
Week 6 Transmission Electron Microscopy (TEM): Imaging
Section 6
Week 7 X-ray photoelectron spectroscopy (XPS)
Section 7
Week 8 Auger Electron Spectroscopy (AES)
Section 8
Week 9 Infrared Spectroscopy
Section 9
Week 10-11 Mechanical Testing at small scales (FIB and Nanoindentation)
Section 10
Week 12 Scanning Probe Microscopy (SPM): Scanning Tunneling microscopy
(STM)
Section 11
Week 13-14 Scanning Probe Microscopy (SPM): Atomic Force Microscopy
(AFM)
Section 12
Week 15 Thermal Analysis (TGA, DTA and DSC)
Section 13
Week 16 Fluorescence and Confocal Microscopy
11.
12.