先修课程、其它学习要求
Pre-requisites or Other
Academic Requirements
后续课程、其它学习规划
Courses for which this course
is a pre-requisite
其它要求修读本课程的学系
Cross-listing Dept.
This course is to provide advanced knowledge and practical operations of advanced XRD, scanning
electron microscopy, transmission electron microscopy, XPS and atomic force microscopy and a
variety of other characterization methods to explore the structure and properties of materials.
The main purpose is to enable students to master the test methods of material analysis, to
understand the basic structure, working principle of a variety of analytical instruments, and
applications of analytical instruments on the material characterization. This is useful for
materials science research.
Understand the background knowledge of several commonly used materials characterization
techniques. Master the basic operations of several analytical instruments on the material
characterization
课程内容及教学日历 (如授课语言以英文为主,则课程内容介绍可以用英文;如团队教学或模块教学,教学日历须注明
主讲人)
Course Contents (in Parts/Chapters/Sections/Weeks. Please notify name of instructor for course section(s), if
this is a team teaching or module course.)
Lecture 1-2. X-Ray Diffraction – Principles and practice(6 hours)
Lecture 3. Scanning Electron Microscopy- Imaging and Analysis (3 hours)
Lecture 4. Transmission Electron Microscopy - Basics(3 hours)
Lecture 5. Transmission Electron Microscopy - Diffraction(3 hours)
Lecture 6. Transmission Electron Microscopy - Imaging(3 hours)
Lecture 7. Transmission Electron Microscopy - Spectrometry(3 hours)
Lecture 8. X-ray photoelectron spectroscopy (XPS) (3 hours)
Lecture 9. Secondary ion mass spectrometry (SIMS) (3 hours)
Lecture 10. Vibrational Spectroscopy (FTIR and Raman) (3 hours)
Lecture 11. Scanning tunneling and Atomic Force Microscopy (STM & AFM) (3 hours)
Lecture 12. Mechanical Testing at small scales (FIB and Nanoindentation) (3 hours)